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Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...

In any chemical analysis, the most important step is sample preparation. The purity of the sample should be ensured before taking a measurement to obtain the optimum results when using any elemental ...

As a surface-sensitive technique, the diffraction signal comes from the top few nanometers of the crystal lattice in EBSD. Hence, the top layer needs to be devoid of oxidation, contamination and ...

Agilent Technologies has launched a sample preparation product for high fat samples that it claims gives labs a better way to address ‘one of their most challenging tasks’. The Agilent Bond Elut ...