Shrinking geometries and efficient design techniques are helping to reduce die sizes, which lowers the cost of semiconductor devices. Despite these improvements, increased competition and smaller ...

Penang, Malaysia, and San Diego, CA. Aemulus, a provider of automated test equipment, and Peregrine Semiconductor, which specializes in RF SOI (silicon on insulator), announced their strategic ...

An increasing number of new and proposed EMC standards are pushing the upper frequency test limits further up in the microwave spectrum. The latest EMC standard released, IEC 61000-4-3:2006, is no ...

HAEFELY HIPOTRONICS announces the launch of the power frequency tester, the MAG 1000. The MAG 1000 is capable of testing all of IEC 61000-4-8. An internal power supply allows the MAG 1000 to be used ...

Although oscillators are critical components in most electronic devices, designers needn’t design oscillators themselves in most cases, because the device contains a great deal of the oscillator ...

The ADL-1 data logger is designed to monitor, record, and wirelessly download all test data from an HVI Very Low Frequency tester to a computer. The ADL-1 data logger from High Voltage, Inc., is ...