Electronic Design

Test Setup Checks Transistors’ hFEs When Tight Control Is Important

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Electronic Design

System-level test contends with billions of untested transistors

Why might you need semiconductor system-level test (SLT)? As Karthik Ranganathan, director for semiconductor solutions at Astronics Test Systems, points out, if you test a 22-nm, ...
Science Daily

Detecting The Spin Of A Single Electron

University of California scientists working at Los Alamos National Laboratory and at the University of California, Los Angeles have demonstrated the ability to detect the spin of a single electron in ...
Digi Times

Revolutionary dynamic AC test system for power transistors

The revolutionary test technologies in Taurus-PDAT has overcome such difficulties and enables manufacturers of Power MOSFETs and IGBTs to test dynamic AC tests in both characterization and high volume ...